Reliability Prediction for Microelectronics, マイクロエレクトロニクスの信頼性予測, 9781394210954, 978-1-394-21095-4【電子書籍 / 1ユーザー】
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Description
Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability.
Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing.
Reliability Prediction for Microelectronics readers will also find:
- Focus on the tools required to perform reliability assessments in real operating conditions
- Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more
- New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI
Contents:
Chapter 1. Conventional Electronic System Reliability Prediction
Chapter 2. The Fundamentals of Failure
Chapter 3. Physics of Failure Based Circuit Reliability
Chapter 4. Transition State Theory
Chapter 5. Multiple Failure Mechanism in Reliability Prediction
Chapter 6. System reliability
Chapter 7. Device Failure Mechanism
Chapter 8. Reliability Modeling of Electronic Packages