EIA-364-32H, 2023: TP-32H Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets

EIA規格 EIA-364-32H, 2023: TP-32H Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets

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EIA規格 EIA-364-32H, 2023: TP-32H Thermal Shock (Temperature Cycling) Test Procedure for Electrical Connectors and Sockets

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EIA-364-32H, 2023: TP-32H Thermal Shock (Temperature Cycling) Test Procedure for
Electrical Connectors and Sockets
EIA規格-364-32H, 2023: 電気コネクターおよびソケットの熱衝撃(温度サイクル)試験手順
発行元 Electronic Components Industry Association (ECIA)
発行年/月 2023年5月
装丁 ペーパー
ページ数 19 ページ
発送予定 海外倉庫よりお取り寄せ 1-2週間以内に発送します
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Description

 

This test is conducted for the purpose of determining the resistance of a given electrical connector or socket to exposure at extremes of high and low temperatures and to the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application.

NOTE — This procedure includes the provision for testing at cryogenic temperatures. Cryogenic temperatures should only be used with specimens specifically designed to be compatible with such temperatures.

Test designation

This test procedure contains 2 test methods; each test method has multiple test conditions – see current designations in table 1. This test procedure has multiple test duration options (number of cycles) – see table 5.

Method A is for air-to-air thermal shock.

Method B is for air-to-liquid nitrogen (cryogenic) thermal shock.